AG-2026.04-1754·quant-ph
Universal Characterization of Classical Qubit Noise
Authors
- Yuan-De Jin
- Zheng-Fei Ye
- Wen-Long Ma
Abstract
We propose a general method to fully characterize a classical stochastic noise process causing qubit dephasing through repetitive Ramsey interferometry measurements (RIMs) on the qubit. Compared to filter-function-based spectroscopy, our method does not require complicated dynamical decoupling pulses and can directly detect arbitrary-order correlation functions of such noise processes. We show that each RIM with a short evolution time and suitably chosen control pulses can perform a direct sampling of the noise field and the $n$-point correlations of the RIM outcomes are proportional to the $n$-point correlation functions of the noise processes. Then we numerically demonstrate this method for characterizing two typical examples of classical noises, including the Ornstein-Uhlenbeck processes producing Gaussian noises and an ensemble of TLFs producing non-Gaussian noises. Our method is independent of qubit lifetime and robust against qubit decoherence and measurement errors, thus offering a universal and efficient protocol for qubit noise spectroscopy across diverse platforms.
Submitted
28 April 20261 week ago
Version
v1
License
CC-BY-4.0
DOI
10.48550/arXiv.2604.25705
Summary
A new method uses simple repeated quantum measurements to fully characterize classical noise affecting qubits, avoiding complex pulse sequences and directly revealing the noise's statistical fingerprint.
- The technique performs 'direct sampling' of noise by running short Ramsey interferometry experiments and reading correlations in measurement outcomes—no need for intricate dynamical decoupling pulses.
- It works for both smooth Gaussian noise (like Ornstein-Uhlenbeck processes) and jagged non-Gaussian noise (like fluctuating two-level defects), making it broadly applicable across quantum platforms.
- Because the method is immune to qubit lifetime limits and measurement errors, it offers a robust, practical alternative to existing spectroscopy techniques for real devices.
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